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Negative-Resistance Characteristics Analysis of Poly-Silicon Resistors Formed on the Flow Sensor
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作者 DianzhongWen 《稀有金属材料与工程》 SCIE EI CAS CSCD 北大核心 2006年第A03期490-491,共2页
In this paper we put forward a new concept about effective trapping center concentration N^e_T which is decreasing with the trapped charge Q corresponding to index movement,based on that,we discuss theⅠ-Ⅴand tempera... In this paper we put forward a new concept about effective trapping center concentration N^e_T which is decreasing with the trapped charge Q corresponding to index movement,based on that,we discuss theⅠ-Ⅴand temperature characteristics of polysilicon resistors.The new concept presents ideal theoretical interpretion for the originally observed current-voltage negative-resistance characteristics of polysilicon resistors formed on the flow sensor,and also for poly-silicon film resistors. The final results agree well with the theoretical current-voltage characteristics. 展开更多
关键词 poly-silicon resistor trapping center negative-resistance grain boundary
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