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A New Method for Clay Mineral Analysis and Its Application in Geology 被引量:3
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作者 王河锦 鲁安怀 陈涛 《Acta Geologica Sinica(English Edition)》 SCIE CAS CSCD 2002年第4期429-436,共8页
X-ray diffraction (XRD) peaks in a low-angle diffraction section of clayminerals, especially those of authigenic origin, have broadening and tailing features in shape.Using the five basic parameters, peak position, pe... X-ray diffraction (XRD) peaks in a low-angle diffraction section of clayminerals, especially those of authigenic origin, have broadening and tailing features in shape.Using the five basic parameters, peak position, peak height, width, shape coefficient and asymmetry,to describe an XRD peak is more accurate, comprehensive and integrated than using only 3 of them,position, height and width. Following the concept of the five basic parameters of an XRD peak, theprogram Decoform proposed in this study provides more information in mineralogical analyses byfitting actual XRD profiles. In combination with the HW-IR plot, Decoform can he systematically andaccurately used in the comprehensive analyses of crystallinity, domain size, lattice strain andquantitative phase. It is also of value for the geological investigations of diagenesis,metamorphism, basin maturity, structural stress field and so on. 展开更多
关键词 clay minerals X-ray diffraction analysis XRD peak fitting CRYSTALLINITY domain size lattice strain quantitative analysis application in geology
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